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IEEE Journal of Lightwave Technology
Volume 18 Number 2, February 2000

Table of Contents for this issue

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Measurement of the Birefringence of UV-Written Channel Silica Waveguides by Magnetooptic Polarization-Mode Coupling

Dietmar Johlen, Gunnar Stolze, Hagen Renner and Ernst Brinkmeyer

Page 185.

Abstract:

We report the measurement of the birefringence in integrated-optical waveguides using magnetooptical coupling between the two principal polarizations of the fundamental mode. We demonstrate this measurement technique for directly ultrviolet (UV)-written channel waveguides in silica-on-silicon and silica-on-silica. The dependence of the waveguide birefringence on the UV-writing power and UV polarization is investigated. The results are compared with the birefringence of etched waveguides in comparable material systems. An analytical formula for the form birefringence in buried channel waveguides is developed, and measured data are compared with theoretical results.

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