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IEEE Journal of Lightwave Technology
Volume 18 Number 9, September 2000

Table of Contents for this issue

Complete paper in PDF format

Accurate Determination of the Ordinary Index Profile of Proton-Exchanged Waveguides

M. Marangoni, R. Ramponi, R. Osellame and V. Russo

Page 1250.

Abstract:

A new method for an accurate characterization of the ordinary refractive index profile of proton-exchanged waveguides is presented and discussed. The method is based on the measurement of the power coupled into radiation modes of the waveguide as a function of the corresponding effective indexes,and allows the determination of the depth and of the film refractive index of the ordinary profile by a least squares fitting of the experimental points. The depth and the film refractive index have been experimentally obtained with an accuracy of 0.005 µm and 0.0001,respectively.

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