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IEEE Transactions on Microwave Theory and Techniques
Volume 48 Number 1, January 2000

Experimental Verification of Pattern Selection for Noise Characterization

Page 156.

Abstract:

A comparison is made between different pattern-selection procedures for noise characterization based on measurements of cold-FET's in a common-source configuration. The measurements were performed using an automated noise setup with one electro-mechanical tuner. The results confirm that a recently developed two-step pattern allows more accurate noise-parameter determination compared to existing practice. The significance of this paper lies in the confirmation of the simulation results presented earlier.

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