2000 IEEE.
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IEEE Transactions on Microwave Theory and Techniques
Volume 48 Number 1, January 2000
Table of Contents for this issue
Complete paper in PDF format
Improvement of the Quality
Factor of RF Integrated Inductors by Layout Optimization
José M. López-Villegas, Member, IEEE
Josep Samitier,
Member, IEEE
Charles Cané,
Pere Losantos and Joan Bausells
Member, IEEE
Page 76.
Abstract:
A systematic method to improve the quality (Q
) factor of RF integrated inductors is presented in this paper.
The proposed method is based on the layout optimization to minimize the series
resistance of the inductor coil, taking into account both ohmic losses, due
to conduction currents, and magnetically induced losses, due to Eddy currents.
The technique is particularly useful when applied to inductors in which the
fabrication process includes integration substrate removal. However, it is
also applicable to inductors on low-loss substrates. The method optimizes
the width of the metal strip for each turn of the inductor coil, leading to
a variable strip-width layout. The optimization procedure has been successfully
applied to the design of square spiral inductors in a silicon-based multichip-module
technology, complemented with silicon micromachining postprocessing. The obtained
experimental results corroborate the validity of the proposed method. A
Q factor of about 17 have been obtained for a 35-nH
inductor at 1.5 GHz, with Q values higher
than 40 predicted for a 20-nH inductor working at 3.5 GHz. The latter is up
to a 60% better than the best results for a single strip-width inductor working
at the same frequency.
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