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IEEE Transactions on Antennas and Propagation
Volume 46 Number 3, March 1998

Table of Contents for this issue

Complete paper in PDF format

Microwave Characterization and Modeling of the Surface Impedance of Fractal Structure Copper Films

Emmanuel Troncet, Guy Ablart, and Levi Allam

Page 434.

Abstract:

The surface impedances Zs of two thin metallic films of different fractal structures realized on printed circuits have been measured in free-space over the frequency range [10 GHz, 20 GHz]. A modeling scheme based on Maxwell's equations and Fresnel's diffraction theory is proposed.

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  4. Centre d'Etudes et de Recherches de Toulouse2, Toulouse, 31400 France.
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