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IEEE Transactions on Antennas and Propagation
Volume 46 Number 11, November 1998

Measured Backscatter from Conductive Thin Films Deposited on Fibrous Substrates

Page 1674.

Abstract:

The functional dependence of the electromagnetic backscatter by thin, straight, dielectric fibers with metallic coatings was measured as a function of coating thickness and conductivity at a wavelength of 0.86 cm (35 GHz). Cu and Ni coatings were applied to fibrous glass substrates (having a nominal diameter of 5.50 \mum) using an evaporative process. Thicknesses of the thin films were directly measured by scanning electron microscopy (SEM) and ranged from 0.02 to 0.70 \mum. Measurements were conducted using single fibers. Measured quantities agreed well with calculations based on recently developed theory.

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