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IEEE Microwave and Guided Wave Letters
Volume 10 Number 2, February 2000

Analysis of Microstrip Lines in Multilayer Structures of Arbitrarily Varying Thickness

Page 52.

Abstract:

A general approach to the full-wave analysis of microstrip lines in multilayer dielectrics of arbitrarily varying thickness is developed. It is based on the discrete mode matching technique (DMM) and uses a full-wave equivalent circuit for the stratified structure, which is simple to apply in a numerical procedure. As an example, the propagation constant of a microstrip line in the interface of two dielectrics as a function of different shape characteristics is computed.

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