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IEEE Microwave and Guided Wave Letters
Volume 10 Number 4, April 2000
Page 134.
Abstract:
Experimental s21 transmission
crosstalk studies have been conducted on silicon-on-insulator substrates with
buried ground planes (GPSOI's) where a 2
per square metal-silicide buried ground plane existed between a 15
-cm p-type silicon
substrate and a 1 µm thick buried CVD oxide
layer. Locally grounded transmission test structures fabricated on GPSOI were
found to exhibit 20 dB increased crosstalk suppression compared to published
data for high resistivity (200
-cm)
SOI substrates incorporating capacitive guard rings over a frequency range
from 500 MHz to 50 GHz. This represents an order of magnitude improvement
in crosstalk power suppression capability compared to existing state-of-the-art
suppression techniques in silicon substrates.
References