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IEEE Microwave and Guided Wave Letters
Volume 10 Number 8, August 2000

Table of Contents for this issue

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A Statistical Algorithm for 3-D Capacitance Extraction

Angelo Brambilla and Paolo Maffezzoni

Page 304.

Abstract:

This letter deals with the problem of parasitic capacitance extraction in deep submicron layouts having general geometries. The here presented extraction method is based on the statistical floating random walk algorithm. It employs a suitable spherical Green function that, in a charge free region, relates the electrical field in the sphere center to the surface electrical potential.

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