2000 IEEE.
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IEEE Transactions on Microwave Theory and Techniques
Volume 48 Number 5, May 2000
Table of Contents for this issue
Complete paper in PDF format
Quasi-TEM Characteristic Impedance
of Micromachined CMOS Coplanar Waveguides
Mehmet Ozgur, Veljko Milanović, Christian Zincke, Michael Gaitan and Mona E. Zaghloul
Page 852.
Abstract:
Micromachined coplanar waveguides (CPW's) fabricated in CMOS
technology consist of glass-encapsulated metal conductor strips, fully suspended
by selective etching of the silicon substrate. The minimum amount of etching
necessary for proper operation of the micromachined waveguides is determined
by using an isolation criterion. In this paper, the quasi-TEM characteristic
impedance of a CPW is derived, including the finite conductor thickness and
the thicknesses of surrounding dielectric layers. The employed analytical
approach is based on conformal mapping and the partial capacitance technique.
The losses both in conductor and dielectric layers are neglected. The analytical
results and proposed approximations are verified by integral-equation computation
and by measurement of various sample structures.
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