2000 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.

IEEE Transactions on Microwave Theory and Techniques
Volume 48 Number 8, August 2000

Table of Contents for this issue

Complete paper in PDF format

Direct Measurement of Crosstalk Between Integrated Differential Circuits

David E. Bockelman and William R. Eisenstadt

Page 1410.

Abstract:

Silicon integrated-circuit test structures have been fabricated that allow direct measurement of crosstalk between differential transmission lines and between single-ended transmission lines in the presence or absence of a metal ground plane. The differential test structures are characterized with mixed-mode scattering parameters (common mode, differential mode, and mode conversion), as measured with the pure-mode vector network analyzer. Comparisons with simulation show good agreement for differential-mode crosstalk,and the dependence of crosstalk on transmission-line separation is presented. Difficulties in simulating crosstalk for even simple structures illustrate the utility of direct measurement of crosstalk.

References

  1. D. E. Bockelman and W. R. Eisenstadt, "Pure-mode network analyzer for on-wafer measurements of mixed-mode s-parameters of differential circuits", IEEE Trans. Microwave Theory Tech., vol. 45, pp.  1071-1077, July  1997.
  2. D. E. Bockelman and W. R. Eisenstadt, "Combined differential and common mode scattering parameters: Theory and simulation", IEEE Trans. Microwave Theory Tech., vol. 43, pp.  1530-1539, July  1995.
  3. D. E. Bockelman and W. R. Eisenstadt, "Calibration and verification of the pure-mode vector network analyzer", IEEE Trans. Microwave Theory Tech., vol. 46, pp.  1009-1012, July  1998.
  4. D. E. Bockelman, W. R. Eisenstadt and R. Stengel, "Accuracy estimation of mixed-mode scattering parameter measurements", IEEE Trans. Microwave Theory Tech, vol. 47, pp.  102-105, Jan.  1999.
  5. D. E. Bockelman, "The theory, measurement, and application of mode specific scattering parameters with multiple modes of propagation", Ph.D. dissertation, Univ. Florida, Dept. Elect. Computer Eng., Gainesville, FL, 1997.
  6. W. R. Eisenstadt and D. E. Bockelman, "Differential and common-mode crosstalk characterization on a silicon substrate", IEEE Microwave Guided Wave Lett., vol.  9, pp.  25-27, Jan.  1999.
  7. Hewlett-Packard Company, Santa Rosa, CA, HP 85150B microwave and RF design syst. user doc., 1992.
  8. R. Lowther, P. A. Begley, G. Bajor, A. Rivoli and W. R. Eisenstadt, "Substrate parasitics and dual-resistivity substrates", IEEE Trans. Microwave Theory Tech, vol. 44, pp.  1170-1174, July  1996.
  9. T. M. Hyltin, "Microstrip transmission on semiconductor dielectrics", IEEE Trans. Microwave Theory Tech, vol. MTT-13, pp.  777-780, Nov.  1965.
  10. "HP Momentum A.02: User's Guide", 3rd ed., Hewlett-Packard Company, Santa Rosa, CA, 1995.