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IEEE Transactions on Microwave Theory and Techniques
Volume 48 Number 12, December 2000

Table of Contents for this issue

Complete paper in PDF format

Suppression of Leakage Resonance in Coplanar MMIC Packages Using a Si Sub-Mount Layer

Sung-Jin Kim, Student Member, IEEE Ho-Sung Yoon, Student Member, IEEE and Hai-Young Lee Member, IEEE

Page 2664.

Abstract:

In this paper, we examined the parasitic leakage resonance of coplanar monolithic microwave and millimeter-wave integrated circuits (MMICs) by the finite-difference time-domain calculations and experiments. The results show that leakages from coplanar MMICs become significantly resonant in finite substrates and packaging enclosures. In order to avoid the leakage resonance,a resonance suppression method using a doped-Si sub-mount layer is proposed and experimented in a frequency range from 0.5 to 40 GHz. The resonance suppression scheme is verified by measuring the S-parameters of the fabricated conductor-backed coplanr waveguides having an Si sub-mount layer of different resistivities (1 m.cm, 15 .cm, and 4 k.cm). The leakage resonance can be completely suppressed using the typical 15-.cm Si sub-mount layer.

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